Electrical overstress (EOS) : (Record no. 20671)

MARC details
000 -LEADER
fixed length control field 05349cam a2200805 i 4500
001 - CONTROL NUMBER
control field ocn851285730
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230823095423.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr |||||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130627s2013 enk ob 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2013026202
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Language of cataloging eng
Description conventions rda
Transcribing agency DLC
Modifying agency YDX
-- N$T
-- IDEBK
-- CDX
-- CUS
-- COO
-- YDXCP
-- OCLCF
-- E7B
-- OTZ
-- EBLCP
-- DEBBG
019 ## -
-- 876848086
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781118703335 (ePub)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1118703332 (ePub)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781118703342 (Adobe PDF)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1118703340 (Adobe PDF)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9781118511886 (hardback)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781118703328
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1118703324
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781299831124 (MyiLibrary)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1299831125 (MyiLibrary)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1118511883 (hdbk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781118511886 (hdbk.)
029 1# - (OCLC)
OCLC library identifier AU@
System control number 000051686184
029 1# - (OCLC)
OCLC library identifier NZ1
System control number 15228751
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV041634390
029 1# - (OCLC)
OCLC library identifier CHVBK
System control number 314703136
029 1# - (OCLC)
OCLC library identifier CHBIS
System control number 010131675
029 1# - (OCLC)
OCLC library identifier DKDLA
System control number 820120-katalog:000667531
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV041911377
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV042989359
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV043396053
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)851285730
Canceled/invalid control number (OCoLC)876848086
042 ## - AUTHENTICATION CODE
Authentication code pcc
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871.852
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 009070
Source bisacsh
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
084 ## - OTHER CLASSIFICATION NUMBER
Classification number TEC008010
Source of number bisacsh
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Voldman, Steven H.
245 10 - TITLE STATEMENT
Title Electrical overstress (EOS) :
Remainder of title devices, circuits, and systems /
Statement of responsibility, etc Steven Voldman.
264 #1 -
-- Chichester, West Sussex, United Kingdom :
-- John Wiley & Sons Inc.,
-- 2013.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource.
336 ## -
-- text
-- rdacontent
337 ## -
-- computer
-- rdamedia
338 ## -
-- online resource
-- rdacarrier
490 1# - SERIES STATEMENT
Series statement ESD series
520 ## - SUMMARY, ETC.
Summary, etc "Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today's modern world.Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today's semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author's series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era"--
-- Provided by publisher.
520 ## - SUMMARY, ETC.
Summary, etc "This book addresses EOS phenomena and distinguish it from other forms of phenomena such as electrostatic discharge (ESD), latchup, and EMC events"--
-- Provided by publisher.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
588 ## -
-- Description based on print version record and CIP data provided by publisher.
526 ## - STUDY PROGRAM INFORMATION NOTE
Department Physical Science
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Semiconductors
General subdivision Failures.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Semiconductors
General subdivision Protection.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Transients (Electricity)
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Overvoltage.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.
Source of heading or term bisacsh
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Overvoltage.
Source of heading or term fast
-- (OCoLC)fst01049455
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Semiconductors
General subdivision Failures.
Source of heading or term fast
-- (OCoLC)fst01112222
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Semiconductors
General subdivision Protection.
Source of heading or term fast
-- (OCoLC)fst01112246
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Transients (Electricity)
Source of heading or term fast
-- (OCoLC)fst01154691
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
655 #7 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
Source of term local
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Print version:
Main entry heading Voldman, Steven H.
Title Electrical overstress (EOS)
Place, publisher, and date of publication Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013
International Standard Book Number 9781118511886
Record control number (DLC) 2013022183
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title ESD series.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1002/9781118703328">http://dx.doi.org/10.1002/9781118703328</a>
Public note Wiley Online Library
994 ## -
-- 92
-- DG1

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