TY  - BOOK
AU  - Leng,Y.
TI  - Materials characterization: introduction to microscopic and spectroscopic methods 
SN  - 9783527670772
AV  - TA403 .L433 2013eb
U1  - 620.11 
PY  - 2013///]
CY  - Weinheim, Germany
PB  - Wiley-VCH
KW  - Materials
KW  - Analysis
KW  - TECHNOLOGY & ENGINEERING
KW  - Engineering (General)
KW  - bisacsh
KW  - Reference
KW  - fast
KW  - Werkstoffpr�ufung
KW  - gnd
KW  - Mikrostruktur
KW  - Mikroskopie
KW  - Spektroskopie
KW  - Thermoanalyse
KW  - Electronic books
N1  - Includes bibliographical references and index; Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis; cse
N2  - Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy)
UR  - http://dx.doi.org/10.1002/9783527670772
ER  -