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Materials characterization : introduction to microscopic and spectroscopic methods / Yang Leng.

By: Material type: TextTextPublisher: Weinheim, Germany : Wiley-VCH, [2013]Copyright date: �2013Edition: Second editionDescription: 1 online resource (xiv, 376 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783527670772
  • 3527670777
  • 9783527670802
  • 3527670807
  • 9783527670796
  • 3527670793
  • 9783527670789
  • 3527670785
  • 9780470822982
  • 0470822988
Subject(s): Genre/Form: Additional physical formats: Print version:: Materials characterization.DDC classification:
  • 620.11
LOC classification:
  • TA403 .L433 2013eb
Online resources:
Contents:
Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
Summary: Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
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Text in English.

Includes bibliographical references and index.

Online resource; title from PDF title page (ebrary platform, viewed May 21, 2014).

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).

Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.

Computer Science and Engineering