000 04303cam a2200853Ii 4500
001 ocn855504094
003 OCoLC
005 20230823094720.0
006 m o d
007 cr cnu|||unuuu
008 130810s2013 gw a ob 001 0 eng d
040 _aEBLCP
_beng
_erda
_epn
_cEBLCP
_dOCLCO
_dDG1
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_dOCLCQ
019 _a860706841
_a960202078
_a961634268
_a962646732
_a988412836
_a992041773
020 _a9783527670772
_q(electronic bk.)
020 _a3527670777
_q(electronic bk.)
020 _a9783527670802
_q(electronic bk. - ePDF)
020 _a3527670807
_q(electronic bk. - ePDF)
020 _a9783527670796
_q(ePub)
020 _a3527670793
_q(ePub)
020 _a9783527670789
_q(mobi)
020 _a3527670785
_q(mobi)
020 _a9780470822982
_q(cloth ;
_qalk. paper)
020 _a0470822988
_q(cloth ;
_qalk. paper)
020 _z9783527334636
_q(print)
020 _z3527334637
_q(print)
029 1 _aAU@
_b000051921502
029 1 _aCHBIS
_b010441942
029 1 _aCHVBK
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029 1 _aDEBBG
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029 1 _aDEBBG
_bBV041634071
029 1 _aDEBBG
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029 1 _aDEBSZ
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029 1 _aDEBSZ
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029 1 _aDEBSZ
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029 1 _aDKDLA
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029 1 _aNZ1
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029 1 _aNZ1
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035 _a(OCoLC)855504094
_z(OCoLC)860706841
_z(OCoLC)960202078
_z(OCoLC)961634268
_z(OCoLC)962646732
_z(OCoLC)988412836
_z(OCoLC)992041773
050 4 _aTA403
_b.L433 2013eb
072 7 _aTEC
_x009000
_2bisacsh
072 7 _aTEC
_x035000
_2bisacsh
082 0 4 _a620.11
049 _aMAIN
100 1 _aLeng, Y.
_q(Yang),
_eauthor.
245 1 0 _aMaterials characterization :
_bintroduction to microscopic and spectroscopic methods /
_cYang Leng.
250 _aSecond edition.
264 1 _aWeinheim, Germany :
_bWiley-VCH,
_c[2013]
264 4 _c�2013
300 _a1 online resource (xiv, 376 pages) :
_billustrations
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
546 _aText in English.
504 _aIncludes bibliographical references and index.
588 0 _aOnline resource; title from PDF title page (ebrary platform, viewed May 21, 2014).
520 _aNow in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
505 0 _aLight Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
650 0 _aMaterials.
650 0 _aMaterials
_xAnalysis.
650 7 _aTECHNOLOGY & ENGINEERING
_xEngineering (General)
_2bisacsh
650 7 _aTECHNOLOGY & ENGINEERING
_xReference.
_2bisacsh
650 7 _aMaterials.
_2fast
_0(OCoLC)fst01011772
650 7 _aMaterials
_xAnalysis.
_2fast
_0(OCoLC)fst01011773
650 7 _aWerkstoffpr�ufung
_2gnd
_0(DE-588)4037934-6
650 7 _aMikrostruktur
_2gnd
_0(DE-588)4131028-7
650 7 _aMikroskopie
_2gnd
_0(DE-588)4039238-7
650 7 _aSpektroskopie
_2gnd
_0(DE-588)4056138-0
650 7 _aThermoanalyse
_2gnd
_0(DE-588)4135675-5
655 4 _aElectronic books.
776 0 8 _iPrint version:
_aLeng, Y. (Yang).
_tMaterials characterization.
_b2nd edition.
_dWeinheim : Wiley-VCH, 2013
_z9783527334636
_w(OCoLC)853507435
856 4 0 _uhttp://dx.doi.org/10.1002/9783527670772
_zWiley Online Library
994 _aC0
_bDG1
999 _c21874
_d21833
526 _bcse